Texas Instruments INA229AIDGST
- Part Number:
- INA229AIDGST
- Manufacturer:
- Texas Instruments
- Ventron No:
- 6402954-INA229AIDGST
- Description:
- 85-V, 20-bit, ultra-precise, SPI output current/voltage/power/energy/charge monitor with alert
- Datasheet:
- ina229
- Common-mode voltage (max) (V)85
- Common-mode voltage (min) (V)-0.3
- Input offset (±) (max) (V)0.000001
- Input offset drift (±) (typ) (V/°C)0.000000002
- Voltage gain (V/V)1
- CMRR (min) (dB)154
- Bandwidth (MHz)0.01
- Supply voltage (max) (V)5.5
- Supply voltage (min) (V)2.7
- Iq (max) (mA)1.1
- Digital interfaceSPI
- FeaturesAlert Function
- Resolution (Bps)20
- RatingCatalog
- Operating temperature range (°C)-40 to 125
The INA229 is an ultra-precise digital power monitor with a 20-bit delta-sigma ADC specifically designed for current-sensing applications. The device can measure a full-scale differential input of ±163.84 mV or ±40.96 mV across a resistive shunt sense element with common-mode voltage support from –0.3 V to 85 V.
The INA229 reports current, bus voltage, temperature, power , energy and charge accumulation while employing a precision ±0.5% integrated oscillator, all while performing the needed calculations in the background. The integrated temperature sensor is ±1°C accurate for die temperature measurement and is useful in monitoring the system ambient temperature.
The low offset and gain drift design of the INA229 allows the device to be used in precise systems that do not undergo multi-temperature calibration during manufacturing. Further, the very low offset voltage and noise allow for use in mA to kA sensing applications and provide a wide dynamic range without significant power dissipation losses on the sensing shunt element. The low input bias current of the device permits the use of larger current-sense resistors, thus providing accurate current measurements in the micro-amp range.
The device allows for selectable ADC conversion times from 50 µs to 4.12 ms as well as sample averaging from 1x to 1024x, which further helps reduce the noise of the measured data.
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