Texas Instruments SN74BCT8373ANT

Name: SN74BCT8373ANT
Brand: Texas Instruments
SKU: 3224667-SN74BCT8373ANT
Availability: InStock
Rating: 5 (1 reviews)

Part Number:: SN74BCT8373ANT

Manufacturer:: Texas Instruments

Ventron No:: 3224667-SN74BCT8373ANT

Description:: IC SCAN TEST DEVICE LATCH 24-DIP

ECAD Model:

Datasheet:: SN74BCT8373ANT

Specifications

Texas Instruments SN74BCT8373ANT technical specifications, attributes, parameters and parts with similar specifications to Texas Instruments SN74BCT8373ANT.

Supply Voltage:
4.5 V ~ 5.5 V
Supplier Device Package:
24-PDIP
Series:
74BCT
Packaging:
Tube
Package / Case:
24-DIP (0.300", 7.62mm)
Operating Temperature:
0°C ~ 70°C
Number of Bits:
8
Mounting Type:
Through Hole
Logic Type:
Scan Test Device with D-Type Latches

Description

part#SN74BCT8373ANT, Manufacturer: is available at ventronchip.com, see description of SN74BCT8373ANT as below .use the request quote form to request SN74BCT8373ANT price and lead time.Every pieces of Electronic Components you buy from ventronchip.com is warranty and quality guaranted.we are an independent distributor of electronic components with extensive inventory in stock.The price and lead time for SN74BCT8373ANT depending on the quantity required, availability and warehouse location.

SN74BCT8373ANT More Descriptions

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70
Latch Transparent 3-ST 8-CH D-Type 24-Pin PDIP Tube
Specialty Function Logic Device w/Octal D-Type Latches
IC SCAN TEST DEVICE LATCH 24-DIP
French Electronic Distributor since 1988

Certification