Texas Instruments SN74ABT8652DWR
- Part Number:
- SN74ABT8652DWR
- Manufacturer:
- Texas Instruments
- Ventron No:
- 3225733-SN74ABT8652DWR
- Description:
- IC SCAN TEST DEVICE 28-SOIC
- Datasheet:
- SN74ABT8652DWR
Texas Instruments SN74ABT8652DWR technical specifications, attributes, parameters and parts with similar specifications to Texas Instruments SN74ABT8652DWR.
- MountSurface Mount
- Mounting TypeSurface Mount
- Package / Case28-SOIC (0.295, 7.50mm Width)
- Operating Temperature-40°C~85°C
- PackagingTape & Reel (TR)
- Series74ABT
- Pbfree Codeyes
- Part StatusObsolete
- Moisture Sensitivity Level (MSL)1 (Unlimited)
- Number of Terminations28
- Additional FeatureINDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; MULTIPLEXED TRANSMISSION OF REGISTERED/REAL TIME DATA
- SubcategoryBus Driver/Transceivers
- Packing MethodTAPE AND REEL
- TechnologyBICMOS
- Terminal PositionDUAL
- Terminal FormGULL WING
- Peak Reflow Temperature (Cel)NOT SPECIFIED
- Number of Functions1
- Supply Voltage4.5V~5.5V
- Reflow Temperature-Max (s)NOT SPECIFIED
- Base Part Number74ABT8652
- Pin Count28
- Qualification StatusNot Qualified
- PolarityNon-Inverting
- Power Supplies5V
- Number of Circuits1
- Max Supply Voltage5.5V
- Min Supply Voltage4.5V
- Load Capacitance50pF
- Number of Ports2
- Number of Bits8
- Propagation Delay5.3 ns
- FamilyABT
- Logic FunctionAND, Transceiver
- Output Characteristics3-STATE
- Logic TypeScan Test Device with Bus Transceiver and Registers
- Max I(ol)0.064 A
- Trigger TypePOSITIVE EDGE
- High Level Output Current-32mA
- Low Level Output Current64mA
- Control TypeINDEPENDENT CONTROL
- Count DirectionBIDIRECTIONAL
- TranslationN/A
- Height Seated (Max)2.65mm
- Width7.5mm
- RoHS StatusROHS3 Compliant
SN74ABT8652DWR Overview
The 74ABT8652 is a transceiver integrated circuit with a base part number of 74ABT8652. It operates at a wide temperature range of -40°C to 85°C, making it suitable for various industrial applications. However, it is important to note that this product is currently listed as obsolete, meaning that it is no longer in production. The moisture sensitivity level (MSL) is 1, indicating that it has an unlimited shelf life. One of its notable features is the independent output enable for each direction, allowing for flexible control. Additionally, it offers multiplexed transmission of registered/real-time data. With a power supply of 5V, this transceiver has one circuit and eight bits, operating as an AND logic function. It has a high-level output current of -32mA, ensuring reliable and efficient performance.
SN74ABT8652DWR Features
SN74ABT8652DWR Applications
There are a lot of Texas Instruments SN74ABT8652DWR Specialty Logic ICs applications.
Solenoids
Car alarm systems
Sensor reporting
Cable network front end
High-speed computer links
Ethernet circuitry
Changeing the frequency from IF to RF
Optical sub-assembly (OSA)
Cell phones
Tuner
The 74ABT8652 is a transceiver integrated circuit with a base part number of 74ABT8652. It operates at a wide temperature range of -40°C to 85°C, making it suitable for various industrial applications. However, it is important to note that this product is currently listed as obsolete, meaning that it is no longer in production. The moisture sensitivity level (MSL) is 1, indicating that it has an unlimited shelf life. One of its notable features is the independent output enable for each direction, allowing for flexible control. Additionally, it offers multiplexed transmission of registered/real-time data. With a power supply of 5V, this transceiver has one circuit and eight bits, operating as an AND logic function. It has a high-level output current of -32mA, ensuring reliable and efficient performance.
SN74ABT8652DWR Features
SN74ABT8652DWR Applications
There are a lot of Texas Instruments SN74ABT8652DWR Specialty Logic ICs applications.
Solenoids
Car alarm systems
Sensor reporting
Cable network front end
High-speed computer links
Ethernet circuitry
Changeing the frequency from IF to RF
Optical sub-assembly (OSA)
Cell phones
Tuner
SN74ABT8652DWR More Descriptions
IC SCAN TEST DEVICE 28-SOIC
BOUNDARY SCAN TRANSCEIVER
Contact for details
The 'ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F652 and 'ABT652 octal bus transceivers and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal bus transceivers and registers. Data flow in each direction is controlled by clock (CLKAB and CLKBA), select (SAB and SBA), and output-enable (OEAB and ) inputs. For A-to-B data flow, data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B data flow but uses CLKBA, SBA, and inputs. Since the input is active low, the A outputs are active when is low and are in the high-impedance state when is high. Figure 1 shows the four fundamental bus-management functions that can be performed with the 'ABT8652. In the test mode, the normal operation of the SCOPETM bus transceivers and registers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990. Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54ABT8652 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8652 is characterized for operation from -40°C to 85°C.
BOUNDARY SCAN TRANSCEIVER
Contact for details
The 'ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F652 and 'ABT652 octal bus transceivers and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal bus transceivers and registers. Data flow in each direction is controlled by clock (CLKAB and CLKBA), select (SAB and SBA), and output-enable (OEAB and ) inputs. For A-to-B data flow, data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B data flow but uses CLKBA, SBA, and inputs. Since the input is active low, the A outputs are active when is low and are in the high-impedance state when is high. Figure 1 shows the four fundamental bus-management functions that can be performed with the 'ABT8652. In the test mode, the normal operation of the SCOPETM bus transceivers and registers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990. Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54ABT8652 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8652 is characterized for operation from -40°C to 85°C.
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