Texas Instruments SN74BCT8240ANT
- Part Number:
- SN74BCT8240ANT
- Manufacturer:
- Texas Instruments
- Ventron No:
- 3715806-SN74BCT8240ANT
- Description:
- IC SCAN TEST DEVICE BUFF 24-DIP
- Datasheet:
- SN74BCT8240ANT
Texas Instruments SN74BCT8240ANT technical specifications, attributes, parameters and parts with similar specifications to Texas Instruments SN74BCT8240ANT.
- MountThrough Hole
- Mounting TypeThrough Hole
- Package / Case24-DIP (0.300, 7.62mm)
- Number of Pins24
- Operating Temperature0°C~70°C
- PackagingTube
- Series74BCT
- Pbfree Codeyes
- Part StatusObsolete
- Moisture Sensitivity Level (MSL)1 (Unlimited)
- Number of Terminations24
- ECCN CodeEAR99
- Additional FeatureSUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
- SubcategoryBus Driver/Transceiver
- TechnologyBICMOS
- Terminal PositionDUAL
- Peak Reflow Temperature (Cel)NOT SPECIFIED
- Number of Functions2
- Supply Voltage4.5V~5.5V
- Terminal Pitch2.54mm
- Reflow Temperature-Max (s)NOT SPECIFIED
- Base Part Number74BCT8240
- Pin Count24
- Qualification StatusNot Qualified
- Power Supplies5V
- Max Supply Voltage5.5V
- Min Supply Voltage4.5V
- Number of Ports2
- Number of Bits4
- Propagation Delay7.5 ns
- FamilyBCT/FBT
- Logic FunctionInverting
- Output Characteristics3-STATE
- Logic TypeScan Test Device with Inverting Buffers
- Output PolarityINVERTED
- Max I(ol)0.064 A
- High Level Output Current-15mA
- Low Level Output Current64mA
- Control TypeENABLE LOW
- Power Supply Current-Max (ICC)52mA
- Number of Output Lines8
- Length31.64mm
- Width7.62mm
- RoHS StatusROHS3 Compliant
SN74BCT8240ANT Overview
ErrnoOperation timed out after 30000 milliseconds with 0 bytes received
SN74BCT8240ANT Features
SN74BCT8240ANT Applications
There are a lot of Rochester Electronics, LLC SN74BCT8240ANT Specialty Logic ICs applications.
WDM transmission
Fiber-to-the-desktop
Car alarm systems
Laser diode bonding
Switches/bridges/routers/servers
Changeing the frequency from IF to RF
Wireless smart house
Shortwave receiver
Wireless showroom
Automation systems
ErrnoOperation timed out after 30000 milliseconds with 0 bytes received
SN74BCT8240ANT Features
SN74BCT8240ANT Applications
There are a lot of Rochester Electronics, LLC SN74BCT8240ANT Specialty Logic ICs applications.
WDM transmission
Fiber-to-the-desktop
Car alarm systems
Laser diode bonding
Switches/bridges/routers/servers
Changeing the frequency from IF to RF
Wireless smart house
Shortwave receiver
Wireless showroom
Automation systems
SN74BCT8240ANT More Descriptions
IC SCAN TEST DEVICE BUFF 24-DIP
Specialty Logic IC; Logic Family:BCT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:24-PDIP; No. of Pins:24; Operating Temperature Range:0°C to 70°C; Input Type:TTL; Leaded Process Compatible:Yes; Output Type:TTL ;RoHS Compliant: Yes
The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F240 and 'BCT240 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal buffers. In the test mode, the normal operation of the SCOPETM octal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8240A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8240A is characterized for operation from 0°C to 70°C.
Specialty Logic IC; Logic Family:BCT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:24-PDIP; No. of Pins:24; Operating Temperature Range:0°C to 70°C; Input Type:TTL; Leaded Process Compatible:Yes; Output Type:TTL ;RoHS Compliant: Yes
The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F240 and 'BCT240 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal buffers. In the test mode, the normal operation of the SCOPETM octal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8240A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8240A is characterized for operation from 0°C to 70°C.
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