SN74ABT8543DWRG4
- Part Number:
- SN74ABT8543DWRG4
- Manufacturer:
- Ventron No:
- 4546285-SN74ABT8543DWRG4
- Description:
- IC SCAN TEST DEVICE 28SOIC
- Datasheet:
- SN74ABT8543DWRG4
SN74ABT8543DWRG4 technical specifications, attributes, parameters and parts with similar specifications to SN74ABT8543DWRG4.
- MountSurface Mount
- Mounting TypeSurface Mount
- Package / Case28-SOIC (0.295, 7.50mm Width)
- Number of Pins28
- Operating Temperature-40°C~85°C
- PackagingTape & Reel (TR)
- Series74ABT
- Part StatusObsolete
- Moisture Sensitivity Level (MSL)1 (Unlimited)
- Number of Terminations28
- Additional FeatureINDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION
- Packing MethodTAPE AND REEL
- TechnologyBICMOS
- Terminal PositionDUAL
- Terminal FormGULL WING
- Peak Reflow Temperature (Cel)NOT SPECIFIED
- Number of Functions1
- Supply Voltage4.5V~5.5V
- Terminal Pitch1.27mm
- Reflow Temperature-Max (s)NOT SPECIFIED
- Base Part Number74ABT8543
- Pin Count28
- Qualification StatusNot Qualified
- Operating Supply Voltage5.5V
- Power Supplies5V
- Number of Ports2
- Number of Bits8
- FamilyABT
- Logic FunctionTransceiver
- Output Characteristics3-STATE
- Logic TypeScan Test Device with Registered Bus Transceiver
- Output PolarityTRUE
- Max I(ol)0.064 A
- Control TypeINDEPENDENT CONTROL
- Count DirectionBIDIRECTIONAL
- TranslationN/A
- Height Seated (Max)2.65mm
- Length17.9mm
- Width7.5mm
- RoHS StatusROHS3 Compliant
SN74ABT8543DWRG4 Overview
The 74ABT series is now considered obsolete. This product has 28 terminations and an additional feature of independent output enable for each direction. It is packaged in a tape and reel format. The supply voltage range is 4.5V to 5.5V. This product has 2 ports and the control type is independent for each direction. It does not have translation capabilities and has a width of 7.5mm.
SN74ABT8543DWRG4 Features
SN74ABT8543DWRG4 Applications
There are a lot of Texas Instruments SN74ABT8543DWRG4 Specialty Logic ICs applications.
IP cameras
Televisions
Thermal management
Laser diode bonding
Radio transmission
Automation systems
Structural bonding
VoIP phones
Fiber optic cable connection network
IPTV front end
The 74ABT series is now considered obsolete. This product has 28 terminations and an additional feature of independent output enable for each direction. It is packaged in a tape and reel format. The supply voltage range is 4.5V to 5.5V. This product has 2 ports and the control type is independent for each direction. It does not have translation capabilities and has a width of 7.5mm.
SN74ABT8543DWRG4 Features
SN74ABT8543DWRG4 Applications
There are a lot of Texas Instruments SN74ABT8543DWRG4 Specialty Logic ICs applications.
IP cameras
Televisions
Thermal management
Laser diode bonding
Radio transmission
Automation systems
Structural bonding
VoIP phones
Fiber optic cable connection network
IPTV front end
SN74ABT8543DWRG4 More Descriptions
ABT SERIES 8-BIT BOUNDARY SCAN REG TRANSCEIVER TRUE OUTPUT PDSO28
IC SCAN TEST DEVICE 28SOIC
Contact for details
The 'ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F543 and 'ABT543 octal registered bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal registered bus transceivers. Data flow in each direction is controlled by latch-enable ( and ), chip-enable ( and ), and output-enable ( and ) inputs. For A-to-B data flow, the device operates in the transparent mode when and are both low. When either or is high, the A data is latched. The B outputs are active when and are both low. When either or is high, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B, but uses , , and . In the test mode, the normal operation of the SCOPETM registered bus transceiver is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990. Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54ABT8543 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8543 is characterized for operation from -40°C to 85°C.
IC SCAN TEST DEVICE 28SOIC
Contact for details
The 'ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F543 and 'ABT543 octal registered bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal registered bus transceivers. Data flow in each direction is controlled by latch-enable ( and ), chip-enable ( and ), and output-enable ( and ) inputs. For A-to-B data flow, the device operates in the transparent mode when and are both low. When either or is high, the A data is latched. The B outputs are active when and are both low. When either or is high, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B, but uses , , and . In the test mode, the normal operation of the SCOPETM registered bus transceiver is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990. Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54ABT8543 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8543 is characterized for operation from -40°C to 85°C.
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