ON Semiconductor MC100EP51DG

MC100EP51DG Overview
8-SOIC (0.154, 3.90mm Width)is the packaging method. The package Tubecontains it. There is a Differentialoutput configured with it. The trigger configured with it uses Positive, Negative. There is an electric part mounted in the way of Surface Mount. A voltage of -3V~-5.5Vis required for its operation. Currently, the operating temperature is -40°C~85°C TA. The type of this D latch is D-Type. In FPGA terms, D flip flop is a type of 100EPseries FPGA. It should not exceed 3GHzin terms of its output frequency. As a result, it consumes 45mA quiescent current. 8terminations have occurred. It is a member of the 100EP51 family. An input voltage of 3.3Vpowers the D latch. Surface Mount mounts this electronic component. The 8pins are designed into the board. This device has the clock edge trigger type of Positive Edge. It is part of the FF/Latchesbase part number family. It is designed with a number of bits of 1. It reaches 5.5Vwhen the supply voltage is maximal (Vsup). If you want to maintain normal operation, you should keep the supply voltage (Vsup) above 3V. Despite its superior flexibility, it relies on 1 circuits to achieve it. On the basis of its reliable performance, this D flip flop is well suited for use with RAIL. There are -4.5V power supplies attached to it. In order to ensure high efficiency, the supply voltage should remain at 3.3V. The 50mA output current allows it to be designed with the greatest amount of flexibility. There is also a characteristic of NECL MODE: VCC = 0V WITH VEE = -3V TO -5.5V. -50mA is set as the high level output current. There is 50mA output current at the low level.

MC100EP51DG Features
Tube package
100EP series
8 pins
1 Bits
-4.5V power supplies

MC100EP51DG Applications
There are a lot of ON Semiconductor MC100EP51DG Flip Flops applications.

Memory
Set-reset capability
ESCC
Computers
Single Down Count-Control Line
Guaranteed simultaneous switching noise level
Bounce elimination switch
Frequency division
Counters
High Performance Logic for test systems