Lattice Semiconductor Corporation LFE3-35EA-6LFN672I
- Part Number:
- LFE3-35EA-6LFN672I
- Manufacturer:
- Lattice Semiconductor Corporation
- Ventron No:
- 3632672-LFE3-35EA-6LFN672I
- Description:
- IC FPGA 310 I/O 672FBGA
- ECAD Model:
-
- Datasheet:
- LFE3-35EA-6LFN672I
Lattice Semiconductor Corporation LFE3-35EA-6LFN672I technical specifications, attributes, parameters and parts with similar specifications to Lattice Semiconductor Corporation LFE3-35EA-6LFN672I.
- Factory Lead Time8 Weeks
- MountSurface Mount
- Mounting TypeSurface Mount
- Package / Case672-BBGA
- Number of Pins672
- Operating Temperature-40°C~100°C TJ
- PackagingTray
- Published2012
- SeriesECP3
- JESD-609 Codee1
- Part StatusActive
- Moisture Sensitivity Level (MSL)3 (168 Hours)
- Number of Terminations672
- ECCN CodeEAR99
- Terminal FinishTin/Silver/Copper (Sn/Ag/Cu)
- HTS Code8542.39.00.01
- SubcategoryField Programmable Gate Arrays
- Voltage - Supply1.14V~1.26V
- Terminal PositionBOTTOM
- Terminal FormBALL
- Peak Reflow Temperature (Cel)250
- Supply Voltage1.2V
- Terminal Pitch1mm
- Reach Compliance Codenot_compliant
- Reflow Temperature-Max (s)30
- Base Part NumberLFE3-35
- Pin Count672
- Number of Outputs310
- Qualification StatusNot Qualified
- Power Supplies1.2V
- Number of I/O310
- RAM Size165.9kB
- Clock Frequency375MHz
- Programmable Logic TypeFIELD PROGRAMMABLE GATE ARRAY
- Number of Logic Elements/Cells33000
- Total RAM Bits1358848
- Number of LABs/CLBs4125
- Combinatorial Delay of a CLB-Max0.379 ns
- Height Seated (Max)2.6mm
- Length27mm
- Width27mm
- RoHS StatusROHS3 Compliant
- Lead FreeLead Free
LFE3-35EA-6LFN672I Overview
The operating temperature of a device is a crucial factor to consider when designing and using electronic components. The TJ,JESD-609 Code, which stands for Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering 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Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's
LFE3-35EA-6LFN672I Features
310 I/Os
Up to 1358848 RAM bits
672 LABs/CLBs
LFE3-35EA-6LFN672I Applications
There are a lot of Lattice Semiconductor Corporation LFE3-35EA-6LFN672I FPGAs applications.
Medical Electronics
Software-defined radio
Camera time adjustments
Electronic Warfare
Data center hardware accelerators
Distributed Monetary Systems
Automotive driver's assistance
Voice recognition
Enterprise networking
Data Mining
The operating temperature of a device is a crucial factor to consider when designing and using electronic components. The TJ,JESD-609 Code, which stands for Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's Joint Electron Device Engineering Council's
LFE3-35EA-6LFN672I Features
310 I/Os
Up to 1358848 RAM bits
672 LABs/CLBs
LFE3-35EA-6LFN672I Applications
There are a lot of Lattice Semiconductor Corporation LFE3-35EA-6LFN672I FPGAs applications.
Medical Electronics
Software-defined radio
Camera time adjustments
Electronic Warfare
Data center hardware accelerators
Distributed Monetary Systems
Automotive driver's assistance
Voice recognition
Enterprise networking
Data Mining
LFE3-35EA-6LFN672I More Descriptions
Latticeecp3 ; 34K Luts; 1.2V Rohs Compliant: Yes |Lattice Semiconductor LFE3-35EA-6LFN672I
33000 4125 FPBGA-672 Programmable Logic Device (CPLDs/FPGAs) ROHS
ECP3 LFE3-35 672-BBGA Tin/Silver/Copper (Sn/Ag/Cu) field programmable gate array 2.6mm 1.2V 375MHz 0.379ns
2.6mm mm FPGAs ECP3 Series 672-BBGA 1mm mm 672
33.3K LUTs 310 I/O 1.2V -6 Speed Low Power IND
33000 4125 FPBGA-672 Programmable Logic Device (CPLDs/FPGAs) ROHS
ECP3 LFE3-35 672-BBGA Tin/Silver/Copper (Sn/Ag/Cu) field programmable gate array 2.6mm 1.2V 375MHz 0.379ns
2.6mm mm FPGAs ECP3 Series 672-BBGA 1mm mm 672
33.3K LUTs 310 I/O 1.2V -6 Speed Low Power IND
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