ADI AD5557CRU
- Part Number:
- AD5557CRU
- Manufacturer:
- ADI
- Ventron No:
- 5148878-AD5557CRU
- Description:
- Dual Current Output, Parallel Input, 16-/14-Bit Multiplying DACs with 4-Quadrant Resistors
- ECAD Model:
-
- Datasheet:
- AD5557CRU
Images are for reference only.See Product Specifications for product details.If you are interested to buy AD5557CRU.
AD5557CRU More Descriptions
Digital to Analog Converters - DAC Dual 14 bit parallel I-out output IC
DAC 2-CH R-2R 14-bit Automotive 38-Pin TSSOP Tube
The AD5547/AD5557 are dual precision, 16-/14-bit, multiplying, low power, current-output, parallel input, digital- to-analog converters. They are designed to operate from single 5 V supply with ±10 V multiplying references for 4-quadrant outputs with up to 4 MHz bandwidth. The built-in 4-quadrant resistors facilitate resistance matching and temperature tracking, which minimize the numbers of components needed for multiquadrant applications. In addition, the feedback resistor (RFB) simplifies the I-V conversion with an external buffer. The AD5547/AD5557 are available in a compact TSSOP-38 package and operate at the extended automotive temperature range of –40°C to 125°C. Applications Automatic Test Equipment Instrumentation Digitally controlled calibration Digital waveform generation
DAC 2-CH R-2R 14-bit Automotive 38-Pin TSSOP Tube
The AD5547/AD5557 are dual precision, 16-/14-bit, multiplying, low power, current-output, parallel input, digital- to-analog converters. They are designed to operate from single 5 V supply with ±10 V multiplying references for 4-quadrant outputs with up to 4 MHz bandwidth. The built-in 4-quadrant resistors facilitate resistance matching and temperature tracking, which minimize the numbers of components needed for multiquadrant applications. In addition, the feedback resistor (RFB) simplifies the I-V conversion with an external buffer. The AD5547/AD5557 are available in a compact TSSOP-38 package and operate at the extended automotive temperature range of –40°C to 125°C. Applications Automatic Test Equipment Instrumentation Digitally controlled calibration Digital waveform generation
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